Publications
World Wide Welfare:
high BRIGHTness
semiconductor lasER for
gEneric Use
high BRIGHTness
semiconductor lasER for
gEneric Use
[Home] [Project] [Participants] [Newsletters] [Publications] [Workshops] [Tutorials] [More...] [Private] [Legal notice]
| Records shown 31 - 35 of 311 |
| << Prev | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11...20 | 21...30 | 31...40 | 41...50 | 51...60 | 61...63 | Next >> |
|
2008 Annual Meetings M. Bou Sanayeh, P. Brick, B. Mayer, M. Muller, M. Reufer, W. Schmid, M. Ziegler, J. W. Tomm, and G. Bacher "Influence of low-absorption laser facets on catastrophic optical damage in AlGaInP lasers" DPG-TagungBerlin25th-29th February 2008 Keywords: AlGaInP lasers, catastrophic optical damage, semiconductor lasers Partners: OSRAM MBI |
|
2007 International Conferences & Congress M. Bou Sanayeh, P. Brick, B. Mayer, M. Muller, M. Reufer, W. Schmid, K. Streubel, S. Schwirzke-Schaaf, J.W. Tomm, A. Danilewsky, and G. Bacher "Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage" DRIP-XIIBerlin9th-13th September 2007 Keywords: AlGaInP lasers, catastrophic optical damage, semiconductor lasers Partners: OSRAM MBI |
|
2007 Annual Meetings M. Bou Sanayeh, P. Brick, W. Schmid, B. Mayer, M. Muller, M. Reufer, K. Streubel, J. W. Tomm, and G. Bacher "Micro-Raman investigation of facet temperature during catastrophic optical damage in AlGaInP laser diodes" DPG-TagungRegensburg26th-30th March 2007 Keywords: AlGaInP lasers, catastrophic optical damage, semiconductor lasers Partners: OSRAM MBI |
|
2007 International Workshop J. P. Huignard "External cavities for controlling spatial & spectral properties of Semi-Conductor lasers" Workshop on High Brightness Laser Diode Sources, with Laser 2007 fair Munich, Germanyjune 2007 Keywords: External cavity laser, Wave mixing, Beam quality improvement, Beam combining Partners: TRT |
|
2007 International Conferences & Congress J. Nagle, M. Oudart "Defect impact and defect signatures in high power laser diodes" 12th International Conference on Defects-Recognition, Imaging &Physics in SemiconductorsBerlin, Germanyseptember 2007 Keywords: Defects, Strain, By-emitter degradation Partners: TRT III-V LAB |
| << Prev | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11...20 | 21...30 | 31...40 | 41...50 | 51...60 | 61...63 | Next >> |